No Label Left Behind: A Unified Surface Defect Detection Model for all Supervision Regimes Paper • 2508.19060 • Published Aug 26 • 11
DINOv3 Collection DINOv3: foundation models producing excellent dense features, outperforming SotA w/o fine-tuning - https://arxiv.org/abs/2508.10104 • 13 items • Updated Aug 21 • 398
